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Automatic Characterization of Exploitable Faults: A Machine Learning Approach

Sayandeep Saha, Dirmanto Jap, Sikhar Patranabis, Debdeep Mukhopadhyay, Shivam Bhasin, Pallab Dasgupta. Automatic Characterization of Exploitable Faults: A Machine Learning Approach. IACR Cryptology ePrint Archive, 2017:1008, 2017. [doi]

Authors

Sayandeep Saha

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Dirmanto Jap

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Sikhar Patranabis

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Debdeep Mukhopadhyay

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Shivam Bhasin

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Pallab Dasgupta

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