Sayandeep Saha, Dirmanto Jap, Sikhar Patranabis, Debdeep Mukhopadhyay, Shivam Bhasin, Pallab Dasgupta. Automatic Characterization of Exploitable Faults: A Machine Learning Approach. IEEE Transactions on Information Forensics and Security, 14(4):954-968, 2019. [doi]
Abstract is missing.