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Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing

M'Hammed Sahnoun, Belgacem Bettayeb, Samuel Bassetto, Michel Tollenaere. Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing. J. Intelligent Manufacturing, 27(6):1335-1349, 2016. [doi]

Authors

M'Hammed Sahnoun

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Belgacem Bettayeb

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Samuel Bassetto

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Michel Tollenaere

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