M'Hammed Sahnoun, Belgacem Bettayeb, Samuel Bassetto, Michel Tollenaere. Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing. J. Intelligent Manufacturing, 27(6):1335-1349, 2016. [doi]
@article{SahnounBBT16,
title = {Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing},
author = {M'Hammed Sahnoun and Belgacem Bettayeb and Samuel Bassetto and Michel Tollenaere},
year = {2016},
doi = {10.1007/s10845-014-0956-x},
url = {http://dx.doi.org/10.1007/s10845-014-0956-x},
researchr = {https://researchr.org/publication/SahnounBBT16},
cites = {0},
citedby = {0},
journal = {J. Intelligent Manufacturing},
volume = {27},
number = {6},
pages = {1335-1349},
}