Deepak R. Sahoo, Tathagata De, Murti V. Salapaka. Observer based imaging methods for Atomic Force Microscopy. In 44th IEEE IEEE Conference on Decision and Control and 8th European Control Conference Control, CDC/ECC 2005, Seville, Spain, 12-15 December, 2005. pages 1185-1190, IEEE, 2005. [doi]