Saurabh Sahu, Kriti Kumar, Angshul Majumdar, Achanna Anil Kumar, M. Girish Chandra. Label-Consistent Convolutional Dictionary Learning for Machine Inspection. In 31st European Signal Processing Conference, EUSIPCO 2023, Helsinki, Finland, September 4-8, 2023. pages 1883-1887, IEEE, 2023. [doi]
Abstract is missing.