Ryota Saito, Sho Takahashi, Takahiro Ogawa, Miki Haseyama. Retrieval of similar inspection records based on metric learning using experienced inspectors' evaluation. In IEEE 5th Global Conference on Consumer Electronics, GCCE 2016, Kyoto, Japan, October 11-14, 2016. pages 1-2, IEEE, 2016. [doi]
Abstract is missing.