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A Comparative Study of Bug Patterns in Java Cloned and Non-cloned Code

Hitesh Sajnani, Vaibhav Saini, Cristina Videira Lopes. A Comparative Study of Bug Patterns in Java Cloned and Non-cloned Code. In 14th IEEE International Working Conference on Source Code Analysis and Manipulation, SCAM 2014, Victoria, BC, Canada, September 28-29, 2014. pages 21-30, IEEE, 2014. [doi]

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Hitesh Sajnani

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Vaibhav Saini

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Cristina Videira Lopes

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