Hitesh Sajnani, Vaibhav Saini, Cristina Videira Lopes. A Comparative Study of Bug Patterns in Java Cloned and Non-cloned Code. In 14th IEEE International Working Conference on Source Code Analysis and Manipulation, SCAM 2014, Victoria, BC, Canada, September 28-29, 2014. pages 21-30, IEEE, 2014. [doi]
@inproceedings{SajnaniSL14,
title = {A Comparative Study of Bug Patterns in Java Cloned and Non-cloned Code},
author = {Hitesh Sajnani and Vaibhav Saini and Cristina Videira Lopes},
year = {2014},
doi = {10.1109/SCAM.2014.12},
url = {http://dx.doi.org/10.1109/SCAM.2014.12},
researchr = {https://researchr.org/publication/SajnaniSL14},
cites = {0},
citedby = {0},
pages = {21-30},
booktitle = {14th IEEE International Working Conference on Source Code Analysis and Manipulation, SCAM 2014, Victoria, BC, Canada, September 28-29, 2014},
publisher = {IEEE},
isbn = {978-0-7695-5304-7},
}