Tomoya Sakai. A Generalized Backward Compatibility Metric. In Aidong Zhang, Huzefa Rangwala, editors, KDD '22: The 28th ACM SIGKDD Conference on Knowledge Discovery and Data Mining, Washington, DC, USA, August 14 - 18, 2022. pages 1525-1535, ACM, 2022. [doi]
@inproceedings{Sakai22-0, title = {A Generalized Backward Compatibility Metric}, author = {Tomoya Sakai}, year = {2022}, doi = {10.1145/3534678.3539465}, url = {https://doi.org/10.1145/3534678.3539465}, researchr = {https://researchr.org/publication/Sakai22-0}, cites = {0}, citedby = {0}, pages = {1525-1535}, booktitle = {KDD '22: The 28th ACM SIGKDD Conference on Knowledge Discovery and Data Mining, Washington, DC, USA, August 14 - 18, 2022}, editor = {Aidong Zhang and Huzefa Rangwala}, publisher = {ACM}, isbn = {978-1-4503-9385-0}, }