Tomoya Sakai. A Generalized Backward Compatibility Metric. In Aidong Zhang, Huzefa Rangwala, editors, KDD '22: The 28th ACM SIGKDD Conference on Knowledge Discovery and Data Mining, Washington, DC, USA, August 14 - 18, 2022. pages 1525-1535, ACM, 2022. [doi]
Abstract is missing.