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An extended notation of FTA for risk assessment of software-intensive medical devices.: Recognition of the risk class before and after the risk control measure

Yoshio Sakai, Seiko Shirasaka, Yasuharu Nishi. An extended notation of FTA for risk assessment of software-intensive medical devices.: Recognition of the risk class before and after the risk control measure. In IEEE 24th International Symposium on Software Reliability Engineering, ISSRE 2013, Pasadena, CA, USA, November 4-7, 2013 - Supplemental Proceedings. pages 211-216, IEEE, 2013. [doi]

Authors

Yoshio Sakai

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Seiko Shirasaka

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Yasuharu Nishi

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