Yoshio Sakai, Seiko Shirasaka, Yasuharu Nishi. An extended notation of FTA for risk assessment of software-intensive medical devices.: Recognition of the risk class before and after the risk control measure. In IEEE 24th International Symposium on Software Reliability Engineering, ISSRE 2013, Pasadena, CA, USA, November 4-7, 2013 - Supplemental Proceedings. pages 211-216, IEEE, 2013. [doi]
@inproceedings{SakaiSN13,
title = {An extended notation of FTA for risk assessment of software-intensive medical devices.: Recognition of the risk class before and after the risk control measure},
author = {Yoshio Sakai and Seiko Shirasaka and Yasuharu Nishi},
year = {2013},
doi = {10.1109/ISSREW.2013.6688900},
url = {http://dx.doi.org/10.1109/ISSREW.2013.6688900},
researchr = {https://researchr.org/publication/SakaiSN13},
cites = {0},
citedby = {0},
pages = {211-216},
booktitle = {IEEE 24th International Symposium on Software Reliability Engineering, ISSRE 2013, Pasadena, CA, USA, November 4-7, 2013 - Supplemental Proceedings},
publisher = {IEEE},
}