Masaki Sakakibara, Yusuke Oike, Takafumi Takatsuka, Akihiko Kato, Katsumi Honda, Tadayuki Taura, Takashi Machida, Jun Okuno, Atsuhiro Ando, Taketo Fukuro, Tomohiko Asatsuma, Suzunori Endo, Junpei Yamamoto, Yasuhiro Nakano, Takumi Kaneshige, Ikuhiro Yamamura, Takayuki Ezaki, Teruo Hirayama. An 83dB-dynamic-range single-exposure global-shutter CMOS image sensor with in-pixel dual storage. In 2012 IEEE International Solid-State Circuits Conference, ISSCC 2012, San Francisco, CA, USA, February 19-23, 2012. pages 380-382, IEEE, 2012. [doi]
@inproceedings{SakakibaraOTKHTMOAFAEYNKYEH12,
title = {An 83dB-dynamic-range single-exposure global-shutter CMOS image sensor with in-pixel dual storage},
author = {Masaki Sakakibara and Yusuke Oike and Takafumi Takatsuka and Akihiko Kato and Katsumi Honda and Tadayuki Taura and Takashi Machida and Jun Okuno and Atsuhiro Ando and Taketo Fukuro and Tomohiko Asatsuma and Suzunori Endo and Junpei Yamamoto and Yasuhiro Nakano and Takumi Kaneshige and Ikuhiro Yamamura and Takayuki Ezaki and Teruo Hirayama},
year = {2012},
doi = {10.1109/ISSCC.2012.6177058},
url = {http://dx.doi.org/10.1109/ISSCC.2012.6177058},
researchr = {https://researchr.org/publication/SakakibaraOTKHTMOAFAEYNKYEH12},
cites = {0},
citedby = {0},
pages = {380-382},
booktitle = {2012 IEEE International Solid-State Circuits Conference, ISSCC 2012, San Francisco, CA, USA, February 19-23, 2012},
publisher = {IEEE},
isbn = {978-1-4673-0376-7},
}