Hikaru Sakamoto, Yang Li, Kazuo Ohta, Kazuo Sakiyama. Fault Sensitivity Analysis Against Elliptic Curve Cryptosystems. In Luca Breveglieri, Sylvain Guilley, Israel Koren, David Naccache, Junko Takahashi, editors, 2011 Workshop on Fault Diagnosis and Tolerance in Cryptography, FDTC 2011, Tokyo, Japan, September 29, 2011. pages 11-20, IEEE, 2011. [doi]
Abstract is missing.