Tsutomu Sakuyama, Takuya Funatomi, Masaaki Iiyama, Michihiko Minoh. Diffraction-Compensating Coded Aperture for Inspection in Manufacturing. IEEE Trans. Industrial Informatics, 11(3):782-789, 2015. [doi]
@article{SakuyamaFIM15,
title = {Diffraction-Compensating Coded Aperture for Inspection in Manufacturing},
author = {Tsutomu Sakuyama and Takuya Funatomi and Masaaki Iiyama and Michihiko Minoh},
year = {2015},
doi = {10.1109/TII.2014.2342374},
url = {http://dx.doi.org/10.1109/TII.2014.2342374},
researchr = {https://researchr.org/publication/SakuyamaFIM15},
cites = {0},
citedby = {0},
journal = {IEEE Trans. Industrial Informatics},
volume = {11},
number = {3},
pages = {782-789},
}