Diffraction-Compensating Coded Aperture for Inspection in Manufacturing

Tsutomu Sakuyama, Takuya Funatomi, Masaaki Iiyama, Michihiko Minoh. Diffraction-Compensating Coded Aperture for Inspection in Manufacturing. IEEE Trans. Industrial Informatics, 11(3):782-789, 2015. [doi]

Abstract

Abstract is missing.