Srinivasa M. Salapaka, Mohammed Dahleh. A model for friction in atomic force microscopy. In American Control Conference, ACC 2000, Chicago, Illinois, USA, 28-30 June, 2000. pages 2102-2107, IEEE, 2000. [doi]
@inproceedings{SalapakaD00,
title = {A model for friction in atomic force microscopy},
author = {Srinivasa M. Salapaka and Mohammed Dahleh},
year = {2000},
doi = {10.1109/ACC.2000.879572},
url = {https://doi.org/10.1109/ACC.2000.879572},
researchr = {https://researchr.org/publication/SalapakaD00},
cites = {0},
citedby = {0},
pages = {2102-2107},
booktitle = {American Control Conference, ACC 2000, Chicago, Illinois, USA, 28-30 June, 2000},
publisher = {IEEE},
isbn = {0-7803-5519-9},
}