Rick Salay, John Mylopoulos. Improving Model Quality Using Diagram Coverage Criteria. In Pascal van Eck, Jaap Gordijn, Roel Wieringa, editors, Advanced Information Systems Engineering, 21st International Conference, CAiSE 2009, Amsterdam, The Netherlands, June 8-12, 2009. Proceedings. Volume 5565 of Lecture Notes in Computer Science, pages 186-200, Springer, 2009. [doi]
Abstract is missing.