Ageing simulation of analogue circuits and systems using adaptive transient evaluation

Felix Salfelder, Lars Hedrich. Ageing simulation of analogue circuits and systems using adaptive transient evaluation. In Wolfgang Nebel, David Atienza, editors, Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015. pages 1261-1264, ACM, 2015. [doi]

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