Felix Salfelder, Lars Hedrich. Ageing simulation of analogue circuits and systems using adaptive transient evaluation. In Wolfgang Nebel, David Atienza, editors, Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015. pages 1261-1264, ACM, 2015. [doi]
Abstract is missing.