Can a deep learning based IoT fault diagnosis system identify more than one fault at a time?

Alireza Salimy, Imene Mitiche, Philip Boreham, Alan Nesbitt, Gordon Morison. Can a deep learning based IoT fault diagnosis system identify more than one fault at a time?. In IEEE International Conference on Internet of Things and Intelligence Systems, IoTaIS 2022, Bali, Indonesia, November 24-26, 2022. pages 19-24, IEEE, 2022. [doi]

Authors

Alireza Salimy

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Imene Mitiche

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Philip Boreham

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Alan Nesbitt

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Gordon Morison

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