Can a deep learning based IoT fault diagnosis system identify more than one fault at a time?

Alireza Salimy, Imene Mitiche, Philip Boreham, Alan Nesbitt, Gordon Morison. Can a deep learning based IoT fault diagnosis system identify more than one fault at a time?. In IEEE International Conference on Internet of Things and Intelligence Systems, IoTaIS 2022, Bali, Indonesia, November 24-26, 2022. pages 19-24, IEEE, 2022. [doi]

@inproceedings{SalimyMBNM22-0,
  title = {Can a deep learning based IoT fault diagnosis system identify more than one fault at a time?},
  author = {Alireza Salimy and Imene Mitiche and Philip Boreham and Alan Nesbitt and Gordon Morison},
  year = {2022},
  doi = {10.1109/IoTaIS56727.2022.9976013},
  url = {https://doi.org/10.1109/IoTaIS56727.2022.9976013},
  researchr = {https://researchr.org/publication/SalimyMBNM22-0},
  cites = {0},
  citedby = {0},
  pages = {19-24},
  booktitle = {IEEE International Conference on Internet of Things and Intelligence Systems, IoTaIS 2022, Bali, Indonesia, November 24-26, 2022},
  publisher = {IEEE},
  isbn = {979-8-3503-9645-4},
}