José Salinas, Yinan N. Shen, Fabrizio Lombardi. A Sweeping Line Approach to Interconnect Testing. IEEE Transactions on Computers, 45(8):917-929, 1996.
@article{SalinasSL96,
title = {A Sweeping Line Approach to Interconnect Testing},
author = {José Salinas and Yinan N. Shen and Fabrizio Lombardi},
year = {1996},
tags = {testing, systematic-approach},
researchr = {https://researchr.org/publication/SalinasSL96},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Computers},
volume = {45},
number = {8},
pages = {917-929},
}