Yinan N. Shen - researchr alias

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Viewing Publication 1 - 18 from 18

1997

On the multiple fault diagnosis of multistage interconnection networks: the lower bound and the CMOS fault modelYinan N. Shen, Xiao-Tao Chen, Susumu Horiguchi, Fabrizio Lombardi. icpp 1997: 350 [doi]

1996

A Sweeping Line Approach to Interconnect TestingJosé Salinas, Yinan N. Shen, Fabrizio Lombardi. TC, 45(8):917-929, 1996.

Graph Algorithms for Conformance Testing Using the Rural ChinesePostman TourYinan N. Shen, Fabrizio Lombardi. siamdm, 9(4):511-529, 1996. [doi]

Space Cutting Approaches for Repairing MemoriesYinan N. Shen, Nohpill Park, Fabrizio Lombardi. iccd 1996: 106-111 [doi]

1994

An Approach for UIO Generation for FSM Verification and ValidationD. Schin, Yinan N. Shen, Fabrizio Lombardi. iscas 1994: 303-306

Scheduling Policies for Fault Tolerance in a VLSI ProcessorYinan N. Shen, Hannu Kari, S. S. Kim, Fabrizio Lombardi. dft 1994: 1-9

1993

Fault detection in TFCMOS/DFCMOS combinational gatesGiacomo Buonanno, Fabrizio Lombardi, Donatella Sciuto, Yinan N. Shen. integration, 15(2):201-227, 1993. [doi]

1992

Evaluation and improvement of fault coverage of conformance testing by UIO sequencesFabrizio Lombardi, Yinan N. Shen. tcom, 40(8):1288-1293, 1992. [doi]

Protocol conformance testing using multiple UIO sequencesYinan N. Shen, Fabrizio Lombardi, Anton T. Dahbura. tcom, 40(8):1282-1287, 1992. [doi]

On the Verification and Validation of Protocols with High Fault Coverage Using UIO SequencesX. Sun, Yinan N. Shen, Fabrizio Lombardi. srds 1992: 196-203

1991

On a new approach for enhancing the fault coverage of conformance testing of protocolsFabrizio Lombardi, Yinan N. Shen, Hannu Kari. spdp 1991: 428-435 [doi]

Protocol Conformance Testing by Discriminating UIO SequencesX. Sun, Yinan N. Shen, Fabrizio Lombardi, Donatella Sciuto. pstv 1991: 349-364

1990

1989

Location and Identification for Single and Multiple Faults in Testable Redundant PLAs for Yield EnhancementYinan N. Shen, Fabrizio Lombardi. itc 1989: 670-678

Protocol Conformance Testing Using Multiple UIO SequencesYinan N. Shen, Fabrizio Lombardi, Anton T. Dahbura. pstv 1990: 131-143

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