Cora Salm, Eric Hoekstra, Jay S. Kolhatkar, André J. Hof, Hans Wallinga, Jurriaan Schmitz. Low-frequency noise in hot-carrier degraded nMOSFETs. Microelectronics Reliability, 47(4-5):577-580, 2007. [doi]
@article{SalmHKHWS07,
title = {Low-frequency noise in hot-carrier degraded nMOSFETs},
author = {Cora Salm and Eric Hoekstra and Jay S. Kolhatkar and André J. Hof and Hans Wallinga and Jurriaan Schmitz},
year = {2007},
doi = {10.1016/j.microrel.2007.01.044},
url = {http://dx.doi.org/10.1016/j.microrel.2007.01.044},
researchr = {https://researchr.org/publication/SalmHKHWS07},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {47},
number = {4-5},
pages = {577-580},
}