Colin Samplawski, Erik G. Learned-Miller, Heesung Kwon, Benjamin M. Marlin. Zero-Shot Learning in the Presence of Hierarchically Coarsened Labels. In 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR Workshops 2020, Seattle, WA, USA, June 14-19, 2020. pages 4015-4019, IEEE, 2020. [doi]
@inproceedings{SamplawskiLKM20,
title = {Zero-Shot Learning in the Presence of Hierarchically Coarsened Labels},
author = {Colin Samplawski and Erik G. Learned-Miller and Heesung Kwon and Benjamin M. Marlin},
year = {2020},
doi = {10.1109/CVPRW50498.2020.00471},
url = {https://doi.org/10.1109/CVPRW50498.2020.00471},
researchr = {https://researchr.org/publication/SamplawskiLKM20},
cites = {0},
citedby = {0},
pages = {4015-4019},
booktitle = {2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR Workshops 2020, Seattle, WA, USA, June 14-19, 2020},
publisher = {IEEE},
isbn = {978-1-7281-9360-1},
}