Twin logic gates: improved logic reliability by redundancy concerning gate oxide breakdown - researchr publication authors

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Hagen SÃ¤mrow, Claas Cornelius, Frank Sill, Andreas Tockhorn, Dirk Timmermann. Twin logic gates: improved logic reliability by redundancy concerning gate oxide breakdown. In Ivan Saraiva Silva, Renato Perez Ribas, Calvin Plett, editors, Proceedings of the 22st Annual Symposium on Integrated Circuits and Systems Design: Chip on the Dunes, SBCCI 2009, Natal, Brazil, August 31 - September 03, 2009. ACM, 2009. [doi]

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Dirk Timmermann

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