A CAD-based approach to failure diagnosis of CMOS LSI s using abnormal Iddq

Masaru Sanada. A CAD-based approach to failure diagnosis of CMOS LSI s using abnormal Iddq. In 14th IEEE VLSI Test Symposium (VTS 96), April 28 - May 1, 1996, Princeton, NJ, USA. pages 186-191, IEEE Computer Society, 1996. [doi]

Abstract

Abstract is missing.