Improving Deep Metric Learning by Divide and Conquer

Artsiom Sanakoyeu, Pingchuan Ma 0006, Vadim Tschernezki, Björn Ommer. Improving Deep Metric Learning by Divide and Conquer. IEEE Trans. Pattern Anal. Mach. Intell., 44(11):8306-8320, 2022. [doi]

Abstract

Abstract is missing.