Ernesto Sánchez, Matteo Sonza Reorda, Giovanni Squillero. On the Transformation of Manufacturing Test Sets into On-Line Test Sets for Microprocessors. In 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 3-5 October 2005, Monterey, CA, USA. pages 494-504, IEEE Computer Society, 2005. [doi]
Abstract is missing.