Ernesto Sánchez, Giovanni Squillero, Alberto Paolo Tonda. Post-silicon failing-test generation through evolutionary computation. In IEEE/IFIP 19th International Conference on VLSI and System-on-Chip, VLSI-SoC 2011, Kowloon, Hong Kong, China, October 3-5, 2011. pages 164-167, IEEE, 2011. [doi]
Abstract is missing.