Ernesto Sánchez, Giovanni Squillero, Alberto Paolo Tonda. Automatic Generation of Software-based Functional Failing Test for Speed Debug and On-silicon Timing Verification. In Magdy S. Abadir, Jay Bhadra, Li-C. Wang, editors, 12th International Workshop on Microprocessor Test and Verification, MTV 2011, Austin, TX, USA, December 5-7, 2011. pages 51-55, IEEE, 2011. [doi]
@inproceedings{SanchezST11-3, title = {Automatic Generation of Software-based Functional Failing Test for Speed Debug and On-silicon Timing Verification}, author = {Ernesto Sánchez and Giovanni Squillero and Alberto Paolo Tonda}, year = {2011}, doi = {10.1109/MTV.2011.19}, url = {http://doi.ieeecomputersociety.org/10.1109/MTV.2011.19}, researchr = {https://researchr.org/publication/SanchezST11-3}, cites = {0}, citedby = {0}, pages = {51-55}, booktitle = {12th International Workshop on Microprocessor Test and Verification, MTV 2011, Austin, TX, USA, December 5-7, 2011}, editor = {Magdy S. Abadir and Jay Bhadra and Li-C. Wang}, publisher = {IEEE}, isbn = {978-1-4577-2101-4}, }