Oliver Sander, Falco Bapp, Timo Sandmann, Viet Vu Duy, Steffen Bähr, Jürgen Becker 0001. Architectural measures against radiation effects in multicore SoC for safety critical applications. In IEEE 57th International Midwest Symposium on Circuits and Systems, MWSCAS 2014, College Station, TX, USA, August 3-6, 2014. pages 663-666, IEEE, 2014. [doi]
Abstract is missing.