Raja K. K. R. Sandireddy, Vishwani D. Agrawal. Diagnostic and Detection Fault Collapsing for Multiple Output Circuits. In 2005 Design, Automation and Test in Europe Conference and Exposition (DATE 2005), 7-11 March 2005, Munich, Germany. pages 1014-1019, IEEE Computer Society, 2005. [doi]
Abstract is missing.