Bernardo Borges Sandoval, Leonardo Heitich Brendler, Fernanda Lima Kastensmidt, Ricardo Reis 0001, Alexandra L. Zimpeck, Rafael B. Schvittz, Cristina Meinhardt. Impact on Radiation Robustness of Gate Mapping in FinFET Circuits under Work-function Fluctuation. In IEEE International Symposium on Circuits and Systems, ISCAS 2023, Monterey, CA, USA, May 21-25, 2023. pages 1-5, IEEE, 2023. [doi]
Abstract is missing.