Elena-Diana Sandru, Emilian David, Georg Pelz. Pre-Silicon Yield Estimation using Machine Learning Regression. In 26th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2019, Genoa, Italy, November 27-29, 2019. pages 103-104, IEEE, 2019. [doi]
@inproceedings{SandruDP19,
title = {Pre-Silicon Yield Estimation using Machine Learning Regression},
author = {Elena-Diana Sandru and Emilian David and Georg Pelz},
year = {2019},
doi = {10.1109/ICECS46596.2019.8964997},
url = {https://doi.org/10.1109/ICECS46596.2019.8964997},
researchr = {https://researchr.org/publication/SandruDP19},
cites = {0},
citedby = {0},
pages = {103-104},
booktitle = {26th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2019, Genoa, Italy, November 27-29, 2019},
publisher = {IEEE},
isbn = {978-1-7281-0996-1},
}