Use of Instance Typicality for Efficient Detection of Outliers with Neural Network Classifiers

Shirish S. Sane, Ashok A. Ghatol. Use of Instance Typicality for Efficient Detection of Outliers with Neural Network Classifiers. In Saraju P. Mohanty, Anirudha Sahoo, editors, 9th International Conference in Information Technology, ICIT 2006, Bhubaneswar, Orissa, India, 18-21 December 2006. pages 225-228, IEEE Computer Society, 2006. [doi]

Abstract

Abstract is missing.