The relationship of code coverage metrics on high-level and RTL code

John Sanguinetti, Eugene Zhang. The relationship of code coverage metrics on high-level and RTL code. In IEEE International High Level Design Validation and Test Workshop, HLDVT 2010, Anaheim, CA, USA, 10-12 June 2010. pages 138-141, IEEE, 2010. [doi]

Authors

John Sanguinetti

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Eugene Zhang

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