John Sanguinetti, Eugene Zhang. The relationship of code coverage metrics on high-level and RTL code. In IEEE International High Level Design Validation and Test Workshop, HLDVT 2010, Anaheim, CA, USA, 10-12 June 2010. pages 138-141, IEEE, 2010. [doi]
@inproceedings{SanguinettiZ10,
title = {The relationship of code coverage metrics on high-level and RTL code},
author = {John Sanguinetti and Eugene Zhang},
year = {2010},
doi = {10.1109/HLDVT.2010.5496649},
url = {http://dx.doi.org/10.1109/HLDVT.2010.5496649},
tags = {coverage},
researchr = {https://researchr.org/publication/SanguinettiZ10},
cites = {0},
citedby = {0},
pages = {138-141},
booktitle = {IEEE International High Level Design Validation and Test Workshop, HLDVT 2010, Anaheim, CA, USA, 10-12 June 2010},
publisher = {IEEE},
}