Raúl A. Santelices, Mary Jean Harrold. Efficiently monitoring data-flow test coverage. In R. E. Kurt Stirewalt, Alexander Egyed, Bernd Fischer, editors, 22nd IEEE/ACM International Conference on Automated Software Engineering (ASE 2007), November 5-9, 2007, Atlanta, Georgia, USA. pages 343-352, ACM, 2007. [doi]
Abstract is missing.