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Thermally-activated degradation of InGaN-based laser diodes: Effect on threshold current and forward voltage

Carlo De Santi, Matteo Meneghini, Michael Marioli, Matteo Buffolo, Nicola Trivellin, T. Weig, K. Holc, K. Köhler, J. Wagner, U. T. Schwarz, Gaudenzio Meneghesso, Enrico Zanoni. Thermally-activated degradation of InGaN-based laser diodes: Effect on threshold current and forward voltage. Microelectronics Reliability, 54(9-10):2147-2150, 2014. [doi]

Authors

Carlo De Santi

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Matteo Meneghini

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Michael Marioli

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Matteo Buffolo

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Nicola Trivellin

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T. Weig

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K. Holc

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K. Köhler

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J. Wagner

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U. T. Schwarz

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Gaudenzio Meneghesso

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Enrico Zanoni

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