Built-in self test of high speed analog-to-digital converters

Edinei Santin, Luís B. Oliveira, João Goes. Built-in self test of high speed analog-to-digital converters. IEEE Instrum. Meas. Mag., 22(6):4-10, 2019. [doi]

Authors

Edinei Santin

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Luís B. Oliveira

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João Goes

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