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Edinei Santin, Luís B. Oliveira, João Goes. Built-in self test of high speed analog-to-digital converters. IEEE Instrum. Meas. Mag., 22(6):4-10, 2019. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: A Fully Integrated and Reconfigurable Architecture for Coherent Self-Testing of High Speed Analog-to-Digital ConvertersEdinei Santin, Luís B. Oliveira, Blazej Nowacki, João Goes. tcas, 58-I(7):1531-1541, 2011. [doi]
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