Thiago Santini, Paolo Rech, Gabriel L. Nazar, Luigi Carro, Flávio Rech Wagner. Reducing embedded software radiation-induced failures through cache memories. In Giorgio Di Natale, editor, 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014. pages 1-6, IEEE, 2014. [doi]
@inproceedings{SantiniRNCW14,
title = {Reducing embedded software radiation-induced failures through cache memories},
author = {Thiago Santini and Paolo Rech and Gabriel L. Nazar and Luigi Carro and Flávio Rech Wagner},
year = {2014},
doi = {10.1109/ETS.2014.6847793},
url = {http://dx.doi.org/10.1109/ETS.2014.6847793},
researchr = {https://researchr.org/publication/SantiniRNCW14},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014},
editor = {Giorgio Di Natale},
publisher = {IEEE},
}