Thiago Santini, Paolo Rech, Gabriel L. Nazar, Luigi Carro, Flávio Rech Wagner. Reducing embedded software radiation-induced failures through cache memories. In Giorgio Di Natale, editor, 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014. pages 1-6, IEEE, 2014. [doi]
Abstract is missing.