Marcelino B. Santos, M. Simões, Isabel C. Teixeira, João Paulo Teixeira. Test preparation methodology for high coverage of physical defects in CMOS digital ICs. In 1995 European Design and Test Conference, ED&TC 1995, Paris, France, March 6-9, 1995. pages 604, IEEE Computer Society, 1995. [doi]
@inproceedings{SantosSTT95-0,
title = {Test preparation methodology for high coverage of physical defects in CMOS digital ICs},
author = {Marcelino B. Santos and M. Simões and Isabel C. Teixeira and João Paulo Teixeira},
year = {1995},
doi = {10.1109/EDTC.1995.470325},
url = {http://doi.ieeecomputersociety.org/10.1109/EDTC.1995.470325},
researchr = {https://researchr.org/publication/SantosSTT95-0},
cites = {0},
citedby = {0},
pages = {604},
booktitle = {1995 European Design and Test Conference, ED&TC 1995, Paris, France, March 6-9, 1995},
publisher = {IEEE Computer Society},
isbn = {0-8186-7039-8},
}