Marcelino B. Santos, M. Simões, Isabel C. Teixeira, João Paulo Teixeira. Test preparation methodology for high coverage of physical defects in CMOS digital ICs. In 1995 European Design and Test Conference, ED&TC 1995, Paris, France, March 6-9, 1995. pages 604, IEEE Computer Society, 1995. [doi]
Abstract is missing.