On High-Quality, Low Energy Built-In Self Test Preparation at RT-Level

Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira, Salvador Manich, L. Balado, Joan Figueras. On High-Quality, Low Energy Built-In Self Test Preparation at RT-Level. J. Electronic Testing, 20(4):345-355, 2004. [doi]

@article{SantosTTMBF04,
  title = {On High-Quality, Low Energy Built-In Self Test Preparation at RT-Level},
  author = {Marcelino B. Santos and Isabel C. Teixeira and João Paulo Teixeira and Salvador Manich and L. Balado and Joan Figueras},
  year = {2004},
  doi = {10.1023/B:JETT.0000039603.89172.2e},
  url = {http://dx.doi.org/10.1023/B:JETT.0000039603.89172.2e},
  tags = {testing, C++},
  researchr = {https://researchr.org/publication/SantosTTMBF04},
  cites = {0},
  citedby = {0},
  journal = {J. Electronic Testing},
  volume = {20},
  number = {4},
  pages = {345-355},
}