M. Santosh, Anjli Bansal, Jitendra Mishra, K. C. Behra, S. C. Bose. Characterization and Compensation Circuitry for Piezo-Resistive Pressure Sensor to Accommodate Temperature Induced Variation. In Brajesh Kumar Kaushik, Sudeb Dasgupta, Virendra Singh, editors, VLSI Design and Test - 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers. Volume 711 of Communications in Computer and Information Science, pages 115-126, Springer, 2017. [doi]
@inproceedings{SantoshBMBB17,
title = {Characterization and Compensation Circuitry for Piezo-Resistive Pressure Sensor to Accommodate Temperature Induced Variation},
author = {M. Santosh and Anjli Bansal and Jitendra Mishra and K. C. Behra and S. C. Bose},
year = {2017},
doi = {10.1007/978-981-10-7470-7_13},
url = {https://doi.org/10.1007/978-981-10-7470-7_13},
researchr = {https://researchr.org/publication/SantoshBMBB17},
cites = {0},
citedby = {0},
pages = {115-126},
booktitle = {VLSI Design and Test - 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers},
editor = {Brajesh Kumar Kaushik and Sudeb Dasgupta and Virendra Singh},
volume = {711},
series = {Communications in Computer and Information Science},
publisher = {Springer},
isbn = {978-981-10-7470-7},
}